| Part Number | Description |
|---|---|
| 07020001-10 | MAP/SAP Replacement Circuit Card |
| 07020002-10 | MAP/SAP Front Panel/Switch Replacement Assembly |
| 07020003-10 | MAP/SAP Audio Digital Encoder Replacement Circuit Card |
| 07040700-10 | Phase Noise Cable Set Kit |
| RAM UPGR INSTL | Installation of RAM Upgrade Kit (excludes travel and per diem) |
| Part Number | Description |
|---|---|
| IRK-0 | Instrument Replacement Kit (Including Cables, Panels, and Drivers) - Complexity 0.0 to 0.9 |
| IRK-1 | Instrument Replacement Kit (Including Cables, Panels, and Drivers) - Complexity 1.0 to 1.9 |
| IRK-2 | Instrument Replacement Kit (Including Cables, Panels, and Drivers) - Complexity 2.0 to 2.9 |
| IRK-3 | Instrument Replacement Kit (Including Cables, Panels, and Drivers) - Complexity 3.0 to 3.9 |
| IRK-4 | Instrument Replacement Kit (Including Cables, Panels, and Drivers) - Complexity 4.0 to 4.9 |
| Part Number | Description |
|---|---|
| KIT INSTALL‑0 | Instrument Replacement Kit Installation and Integration (Including Cables, Panels, and Drivers) - Complexity 0.0 to 0.9 |
| KIT INSTALL‑1 | Instrument Replacement Kit Installation and Integration (Including Cables, Panels, and Drivers) - Complexity 1.0 to 1.9 |
| KIT INSTALL‑2 | Instrument Replacement Kit Installation and Integration (Including Cables, Panels, and Drivers) - Complexity 2.0 to 2.9 |
| KIT INSTALL‑3 | Instrument Replacement Kit Installation and Integration (Including Cables, Panels, and Drivers) - Complexity 3.0 to 3.9 |
| KIT INSTALL‑4 | Instrument Replacement Kit Installation and Integration (Including Cables, Panels, and Drivers) - Complexity 4.0 to 4.9 |
Frequently, existing test instrumentation utilizes hardware components that have become obsolete and unmaintainable. In particular, some waveform digitizers use high power Electron Bombarded Semiconductor (EBS) tubes for their Analog-Digital-Conversion (ADC) subsystem. These EBS tubes are subject to obsolescence. EBS requirements for high voltage power decrease reliability to unacceptable levels. Retrofit Kits are utilized to overcome these obsolescence problems.
| Part Number | Description |
|---|---|
| RK LPADC | Low Power ADC Subsystem Retrofit Kit for Waveform Digitizers Retrofit existing test instrument ADC subsystem with new technology that is functionally equivalent with superior reliability. Benefits of test instrument retrofit include extended service life, enhanced utilization, reduced maintenance costs, improved reliability, and obsolescence neutral. Features of the Low Power ADC Subsystem Retrofit Kit include dual 8-bit ADCs, 500 Msps sampling rate per channel, low power requirement (3.3 V and 2.25 V), built-in-test and calibration, gray or binary output data formats, and flexible configuration. |
| RP LPADC | Repair of Low Power ADC Subsystem Retrofit Kit for Waveform Digitizers |