| MC100M MCBRAT Test System |
| The Munitions Capable BRAT (MCBRAT) tests smart weapons systems. It initiates Built-In-Test (BIT), provides BIT status, and uploads/downloads and verifies applicable software, including mission planning data resident in the smart weapon. MCBRAT is designed for operation in harsh flight line environments. |
| MCBRAT conforms to MIL-STD-1760 Class II interface and links with the weapon via a common MIL-STD-1760 connector. MCBRAT consists of: |
| A ruggedized and self-contained laptop computer controller |
| Serial RS-232 Communications |
| Serial RS-422 Communications |
| MIL-STD-1553 Interface |
| PCMCIA Interface (external accessible) |
| Test Adapter Unit (TAU) |
| MIL-STD-1760 Class II Port |
| Self Test Wraparound Port |
| Interconnecting cables, transit cases |
| MCBRAT is compatible with: |
| Joint Direct Attack Munition (JDAM), Joint Standoff Weapon (JSOW), Wind Corrected Munitions Dispenser (WCMD), Joint Air-to-Surface Standoff Missile (JASSM), Standoff Land Attack Missile Expanded Response (SLAM-ER), Hard Target Smart Fuze (HTSF), Miniature Air Launched Decoy (MALD), Paveway, AGM-142, AIM-9X missile, and the gamut of rail launchers and bomb rack units supporting these munitions. |
| State-of-the-Art-Technology |
| The MCBRAT features VXI instrument-on-a-card, sub-module instrument-on-a-card, and modular technologies to provide complex testing capabilities for munitions and flight line requirements. |
| High Speed Dynamic Digital Option |
| Up to 192 pins I/O configured for mixed logic families to frequencies less than or equal to 50 MHz. |
| DC and AC Power Supplies and Electronic Loads |
| The power system is a reconfigurable precision power subsystem designed to meet the challenges of high tech ATE. |
| Operating Environment |
| Supports flight line requirements. |
| Multiple Instrument Synchronization |
| Complete access at the interface of all instrument "trigger" signals allows multiple instrument synchronizations, or "event" testing. This technique can reduce the software overhead for a test and increase throughput. |
| Measurement Capability to 200 MHz |
| Instrument measurement capability in the standard configuration is to 200 MHz. |
| Computer |
| Intel-Based PC (custom configurations available as options) |
| Test Languages |
| TBASIC Test Language (options available) |
MC100M
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