The BRAT^® Test System

Multiple Instrument Synchronization

Complete access at the interface of all instrument "trigger" signals allows multiple instrument synchronizations, or "event" testing. This technique can reduce the software overhead for a test and increase throughput.

Measurement Capability to 250 MHz

Dedicated RF channels are used to route signals of up to 3 GHz to the analog bus; however, instrument measurement capability in the standard configuration is to 250 MHz.

Specifications

Computer

Intel-Based PC

(custom configurations available as options)

Test Languages

TBASIC^® Test Language (options available)

Dynamic Digital

160 I/O Pins 3 to 9 ns pin skew

Subcycles of 6.25 ns to 409.6 ms in 6.25 ns steps

20 MHz pattern rate, 160 MHz control timing

64K pin depth

TTL compatible levels (CMOS/ELL/Programmable options available)

External triggering (ECL and TTL)

External clocking

(options for additional digital pins are available)

Static Digital Quad 8-Bit Latch

Four independently programmable 8-bit ports for GPIO handshake modes

TTL Compatible I/O and Control

Block Mode Transfer - 325 Kbytes/s

Digital Multimeter

AC/DC Voltage: Range: 30 mV to 300 V

Resolution: 10 nV to 100 mV

Resistance (2/4 Wire): Range: 30 W to 3 GW

Resolution: 10 mW to 1 KW

Frequency: Range: 10 Hz to 1.5 MHz

Period: Range: 0.10 s to 667 ns

DC Common Mode Rejection: 140 dB

Universal Counter/Timer

Frequency: Range: 0.001 Hz to 200 MHz

Period: Range: 5 ns to 1000 s

Resolution: 9 digits

AC/DC Voltages: Range: 200 mV p-p to ±10.2 V p-p

(´atten)

Resolution: 30 mV (´atten)

Time Interval: Range: 1 ns to 1000 s

Resolution: 2 ns + trigger error (avg)

The Benchtop Reconfigurable Automatic Tester (BRAT^®) is an economical Commercial-Off-The-Shelf (COTS), flexible test system, based on an open architecture of commercial equipment in a modular design. Its primary use is as Automatic Test Equipment (ATE), either through test programming languages or by the use of the latest object-oriented graphical programming environments. The physical Benchtop Reconfigurable assembly allows easy access to all of the modules as well as room for expansion/reconfiguring, and makes transporting simple. This design allows for the Modular Measurement System (MMS) add-on as an expansion option. The interface provides over 400 universal analog test points, 160 dynamic digital test points, 32 static digital test points, and 20 two-wire, 50 W dedicated RF paths, reducing the number and complexity of ITAs.

State-of-the-Art-Technology

The BRAT^® features VXI instrument-on-a-card and modular technologies to provide complex testing capabilities in a compact workstation.

High Speed Dynamic Digital

The timing control lines operate at up to 160 MHz while the I/O pins operate at up to 20 MHz. 64K of memory are behind each pin, which can be run continuously or in segments for multiple tests.

Multiple Programmable DC and AC Power Supplies

The power system is a reconfigurable precision power subsystem designed to meet the challenges of high tech ATE.

Operating Environment

The standard operating environment is Windows. The software packages installed are determined by the user's test requirements.

The BRAT^® Test System

Rise/Fall Time Range: 15 ns to 1000 s

Pulse Width Range: 5 ns to 1 ms

Ratio Range: 0.001 Hz to 100 MHz

Totalize Range: 0 to [(1.E + 12) - 1]

Amplitude Range: 100 mV p-p to 10 V p-p

Trigger Range: ±10.2 V

Selectable Impedance: (HI Z or 50 W)

HI Z: (´1) 500 KW II 40 pF

(´10) 1 MW II < 20 pF

Digitizing Oscilloscope

Bandwidth: DC to 250 MHz

Maximum Sample Rate: 1 GSa/s

Maximum Input Voltage: 1 MW ±250 V/50 W 5 V rms

Vertical Resolution: ±0.1% (averaging)

Time Base: Range: 10 ns to 50 s full scale

Resolution: 20 ps

Synthesized Function/Sweep Generator

Frequency Range: Sine 1 mHz to 21 MHz

Square 1 mHz to 11 MHz

Triangle/Ramp 1 mHz to 11 KHz

TTL Clock 1 mHz to 60 MHz

Frequency Resolution: 11 digits

Amplitude (50 W): Range: 1 mV to 10 V p-p

Resolution: 4 digits

Arbitrary Function Generator

User Defined Waveforms

13-bit resolution, 40 MSa/s

256K sample memory with sequencer (custom waveforms)

Built-In Functions

Frequency Range: Sine: to 10.7 MHz

Square: to 5 MHz

Triangle/Ramp: to 100 KHz

Amplitude (50 W): Range: ±5.1 V

Resolution: 1.25 mV

Amplitude (Open): Range: ±10.2 V

Resolution: 2.5 mV

Arbitrary Function Generator (continued)

Additional Modes

Frequency Sweep to 10 MHz

Frequency Hop to 10 MHz

Frequency Shift to 2 M changes/s

Phase Modulate to 500 KHz

Synchro/Resolver Simulator and Indicator

Independent D/S and S/D functions

16- or 20-bit binary resolution

Dynamic rate and directions

Programmable

Reference Input: 26 or 115 V rms

Signal I/O: 11.8, 26, and 90 V L-L

Form C Switch

32-Channel

5 A

Nonlatching Relays (SPDT)

DC Power Supply

Eight programmable DC supplies

Resolution: 10 mVA

Range: 2 ´0 to 7 Vdc @ 15 A

2 ´0 to 20 Vdc @ 10 A

2 ´0 to 32 Vdc @ 6.25 A

1 ´0 to 160 Vdc @ 1.25 A

1 ´0 to 320 Vdc @ 0.625 A

AC Power Supply (Three-Phase)

Frequency Resolution: 0.01 Hz 40 to 99.9 Hz

0.05 Hz 100 to 999.9 Hz

0.5 Hz 1000 to 5000 Hz

Range: 0 to 312 Vac

Switching

Maximum Current: 1 A

> 400 Universal Analog Test Points

Options Available

Custom configuration available. Call for details.